Computing Reviews
Today's Issue Hot Topics Search Browse Recommended My Account Log In
Review Help
Search
Automated synthesis of resilient and tamper-evident analog circuits without a single point of failure
Kim K., Wong A., Lipson H. Genetic Programming and Evolvable Machines11 (1):35-59,2010.Type:Article
Date Reviewed: Aug 19 2010

When talking about fault tolerance, we seek to put in place mechanisms that would keep a system running with minimal degradation, despite the malfunctioning of a component. Typically, in the case of failure, redundant components jump into place and build consensus via voting. This paper looks into building fault tolerance in a circuit design by designing circuits with no single points of failure. The issue of fault tolerance now becomes a rather continuous problem that involves considerations about the distribution of the degradation effects, as opposed to the one-time (digital, finite) incident of a one-component failure in systems with single points of failure.

The significance of this paper is at least two-fold. First, it provides a great overview and taxonomy of existing literature and approaches. Second, the authors have actually emulated the systems discussed.

The paper is a pleasure to read, and very easy to follow. There are abundant explanations and figures that support the claims and findings. The generation of the circuits is supported by the implementation of genetic algorithms, with cleverly chosen parameters and fitness functions. Despite intuitive expectations that the building of these circuits would drastically increase the amount of hardware components used, this paper indicates that it may not be so.

Although it does not cover the universal case of building circuits that “rock,” even when components fail, this is still a well-done paper that motivates further research into specific types of circuits.

Reviewer:  Goran Trajkovski Review #: CR138290 (1101-0052)
Bookmark and Share
  Featured Reviewer  
 
Reliability, Testing, And Fault-Tolerance (B.8.1 )
 
 
Analog Computers (C.1.m ... )
 
 
Fault Tolerance (C.4 ... )
 
 
Reliability, Testing, And Fault-Tolerance (B.3.4 )
 
 
Artificial Intelligence (I.2 )
 
Would you recommend this review?
yes
no
Other reviews under "Reliability, Testing, And Fault-Tolerance": Date
Scheduling tests for VLSI systems under power constraints
Chou R., Saluja K. (ed), Agrawal V. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 5(2): 175-185, 1997. Type: Article
Feb 1 1998
Introduction to IDDQ testing
Chakravarty S., Thadikaran P., Kluwer Academic Publishers, Norwell, MA, 1997. Type: Book (9780792399452)
Feb 1 1998
Fault-tolerant self-organizing map implemented by wafer-scale integration
Yasunaga M., Hachiya I., Moki K., Kim J. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 6(2): 257-265, 1998. Type: Article
Oct 1 1998
more...

E-Mail This Printer-Friendly
Send Your Comments
Contact Us
Reproduction in whole or in part without permission is prohibited.   Copyright 1999-2024 ThinkLoud®
Terms of Use
| Privacy Policy