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	Browse All Reviews > Hardware (B) > Memory Structures (B.3) > Reliability, Testing, And Fault-Tolerance (B.3.4)     Reliability, Testing, And Fault-Tolerance (B.3.4) See Reviews     Subject Descriptors: Diagnostics (1) Error-Checking (4) Redundant Design (3) Test Generation (3)   Proper Nouns: There are no proper nouns with reviews under B.3.4.     Reviews limited to: All General Terms Algorithms Design Documentation Economics Experimentation Human factors Languages Legal Aspects Management Measurement Performance Reliability Security Standardization Theory Verification     Reviews about "Reliability, Testing, And Fault-Tolerance (B.3.4)": Partitioning techniques for partially protected caches in resource-constrained embedded systems Lee K., Shrivastava A., Dutt N., Venkatasubramanian N. ACM Transactions on Design Automation of Electronic Systems 15(4): 1-30, 2010.  Type: Article 3D parity checking models for errors in RAM memories used in space on-board computers Kuo N., Gough M. Microprocessors & Microsystems 12(7): 599-605, 1988.  Type: Article An overview of deterministic functional RAM chip testing Van de Goor A., Verruijt C. ACM Computing Surveys 22(1): 5-33, 1990.  Type: Article Random Pattern Testing Versus Deterministic Testing of RAMs David R., Fuentes A., Courtois B. IEEE Transactions on Computers 38(5): 637-650, 1989.  Type: Article Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories Mazumder P., Patel J. IEEE Transactions on Computers 38(3): 394-407, 1989.  Type: Article A triple modular redundancy technique providing multiple-bit error protection without using extra redundancy van Gils W. IEEE Transactions on Computers 35(7): 623-631, 1986.  Type: Article The reliability of computer memories McEliece R. Scientific American 252(1): 88-95, 1985.  Type: Article Related Topics B.3.4 Reliability, Testing, And Fault-Tolerance   - Performance And Reliability
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