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Checking experiments in sequential machines
Bhattacharya A., John Wiley & Sons, Inc., New York, NY, 1989. Type: Book (9789780470213650)
Date Reviewed: May 1 1990

This book presents a complete discussion of the theory and techniques of fault detection and correction for sequential logic circuits. The intended audience seems to be professionals in the field as the book is rather terse. It could serve as a graduate textbook although it contains no problems to be solved. The book begins with a discussion of terminology, then gives a comprehensive review of methods for checking sequential machines for faults. The ensuing chapters cover the use of augmented logic and extra inputs for fault detection. The book has a bibliography of 230 entries. The only flaw to note is that it could have been proofread more thoroughly. The English is somewhat awkward and occasionally obscure. Despite this, I recommend the book highly.

Reviewer:  E. L. Bosworth Review #: CR114239
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Sequential Circuits (B.6.1 ... )
 
 
Combinational Logic (B.6.1 ... )
 
 
Testability (B.6.2 ... )
 
 
Performance of Systems (C.4 )
 
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