Computing Reviews
Today's Issue Hot Topics Search Browse Recommended My Account Log In
Review Help
Search
Statistical modeling and feature selection for seismic pattern recognition
Kubichek R., Quincy E. Pattern Recognition18 (6):441-448,1985.Type:Article
Date Reviewed: Sep 1 1986

This is the first of two papers that describe a procedure for pattern recognition of seismic data in order to locate deposits of hydrocarbons. [For a review of the second paper, see <CR> this issue, Rev. 8609-0852.] This paper is concerned with the generation of training pattern and with feature selection. To obtain a sufficient variety of training patterns, seismic traces are synthesized from density and velocity data of actual well logs which provide the basis for an a priori probability distribution. Out of 29 commo- nly used features that are extracted from the traces, sets of three to four are selected by a “bottom-up” procedure. In the given example, an 85 percent discrimination accuracy is obtained for the given example.

Reviewer:  F. W. Stallmann Review #: CR110482
Bookmark and Share
 
Waveform Analysis (I.5.4 ... )
 
 
Earth And Atmospheric Sciences (J.2 ... )
 
 
Feature Evaluation And Selection (I.5.2 ... )
 
 
Statistical (I.5.1 ... )
 
Would you recommend this review?
yes
no
Other reviews under "Waveform Analysis": Date
Syntactic pattern recognition for the recognition of bright spots
Huang K., Fu K. Pattern Recognition 18(6): 421-428, 1985. Type: Article
Sep 1 1986
Image processing of seismograms: (A) Hough transformation for the detection of seismic patterns; (B) thinning processing in the seismogram
Huang K., Fu K., Sheen T., Cheng S. Pattern Recognition 18(6): 429-440, 1985. Type: Article
Mar 1 1987
Identification of seismic stratigraphic traps using statistical pattern recognition
Kubichek R., Quincy E. Pattern Recognition 18(6): 449-458, 1985. Type: Article
Sep 1 1986
more...

E-Mail This Printer-Friendly
Send Your Comments
Contact Us
Reproduction in whole or in part without permission is prohibited.   Copyright 1999-2024 ThinkLoud®
Terms of Use
| Privacy Policy