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	Browse All Reviews > Hardware (B) > Integrated Circuits (B.7) > Reliability And Testing (B.7.3) > Test Generation (B.7.3...)     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending     1-6 of 6 Reviews about "Test Generation (B.7.3...)": Date Reviewed   AVPGEN--a test generator for architecture verification Chandra A., Iyengar V., Jameson D., Jawalekar R., Nair I., Rosen B., Mullen M., Yoon J., Armoni R., Geist D., Wolfsthal Y. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 3(2): 188-200, 1995.  Type: Article AVPGEN is a system that assists in the creation of tests for the verification of a processor architecture. It consists of a database of processor features; a language, SIGL, in which test templates can be specified; and a supervisor th... Jan 1 1996   Built-In Testing of Integrated Circuit Wafers Rangarajan S., Fussell D., Malek M. IEEE Transactions on Computers 39(2): 195-205, 1990.  Type: Article Assume that a wafer contains an array of identical integrated circuits, that a test can be applied to all of these in parallel, and that the test results for each IC can be compared. In the usual case a test is applied and the results ... Mar 1 1991   Selecting test methodologies for PLAs and random logic modules in VLSI circuits--an expert systems approach Bhawmik S., Narang V., Chaudhuri P. Integration, the VLSI Journal 7(3): 267-281, 1989.  Type: Article Design for testability (DFT) involves methods of designing circuits and systems to make the creation of tests for manufacturing defects easier. A wide range of DFT techniques exist. Each method involves certain costs in such terms as c... Aug 1 1990   Design for testability of a 32-bit TRON microprocessor Nozuyama Y., Nishimura A., Iwamura J. Microprocessors & Microsystems 13(1): 17-27, 1989.  Type: Article Many techniques exist for improving the testability of integrated circuits, and many papers describe them. A paper that describes how some of these techniques are combined in a real integrated circuit, however, is not so common. This p... Oct 1 1989   LSI/VLSI testability design Tsui F., McGraw-Hill, Inc., New York, NY, 1987.  Type: Book (9789780070653412) This is not just a book on Design For Testability (DFT); it is a plea for the importance of using DFT in all stages of design. In particular, it advocates In-System At-Speed Testability (ISAST) as the solution to testing and diagnosis ... Oct 1 1987   Test generation for digital systems Abraham J., Agarwal V., Prentice-Hall, Inc., Upper Saddle River, NJ, 1986.  Type: Book (9789780133082302) This is a nicely written piece surveying the literature in test generation techniques. The D-algorithm, a classical approach, is covered along with the new random testing and signature analysis techniques. A background in digital syste... Oct 1 1987       Display 510152550100 per page
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