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Browse All Reviews > Hardware (B) > Logic Design (B.6) > Reliability And Testing (B.6.2)
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1-10 of 11
Reviews about "Reliability And Testing (B.6.2)":
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Using implications to choose tests through suspect fault identification Dworak J., Nepal K., Alves N., Shi Y., Imbriglia N., Bahar R. ACM Transactions on Design Automation of Electronic Systems 18(1): 1-19, 2012. Type: Article
Building upon previous work that used login implications to improve the reliability of digital circuits in detecting online faults, this paper adds diagnosis properties to help localize the portion of the circuit where the fault has oc...
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Apr 25 2013 |
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Efficient branch and bound search with application to computer-aided design Chen X., Bushnell M., Kluwer Academic Publishers, Norwell, MA, 1996. Type: Book (9780792396734)
Chen and Bushnell describe an improved branch-and-bound search method for logic justification, a problem in computer-aided design (CAD). The improvement arises from avoiding duplicate computations (without using search decision trees)....
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Aug 1 1997 |
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Accumulator-Based Compaction of Test Responses Rajski J., Tyszer J. IEEE Transactions on Computers 42(6): 643-650, 1993. Type: Article
A technique of testing VLSI circuits using a signature method is described and analyzed. The technique is best suited for circuits that may have an adder available as part of the circuit. The basic idea is to use the adder as an accumu...
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Nov 1 1994 |
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Sequential logic testing and verification Ghosh A., Devadas S., Newton A., Kluwer Academic Publishers, Norwell, MA, 1992. Type: Book (9780792391883)
Quite a few good texts about combinatorial logic testing are available. Similarly, a number of existing techniques and tools can efficiently synthesize and generate tests for such circuits. Testing sequential circuits and synthesis of ...
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Jul 1 1994 |
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On Computing Signal Probability and Detection Probability of Stuck-At Faults Chakravarty S., Hunt H. IEEE Transactions on Computers 39(11): 1369-1377, 1990. Type: Article
A key problem for random and pseudorandom testing and the testability analysis of combinatorial circuits is to determine the quality of certain test patterns. For this it is important to know with what probability a stuck-at fault at a...
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Jun 1 1991 |
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Design of High-Speed and Cost-Effective Self-Testing Checkers for Low-Cost Arithmetic Codes Piestrak S. IEEE Transactions on Computers 39(3): 360-374, 1990. Type: Article
Let X be an input space, the set of all 2n input n-tuples to a combinational circuit H with n inputs and s outputs. X has a complemented decomposition X=M&pl...
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Dec 1 1990 |
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Invariance of complexity measures for networks with unreliable gates Pippenger N. Journal of the ACM 36(3): 531-539, 1989. Type: Article
The complexity of a function is invariant, within a constant factor, over any choice of a finite and complete basis; this important result in Boolean circuit complexity permits us to state results without bothering about the underlying...
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Oct 1 1990 |
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Hardware fault tolerance Carter W., John Wiley & Sons, Inc., New York, NY, 1986. Type: Book (9789780471845188)
This chapter is a survey of some aspects of reliable design and hardware fault tolerance. It stresses the important areas of self-testing and self-restoration of faulty computer systems. Self-restoration can be accomplished through sys...
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Feb 1 1989 |
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Logic testing and design for testability Fujiwara H., MIT Press, Cambridge, MA, 1986. Type: Book (9789780262060967)
This text provides an excellent introduction to the problems of testing logic circuits. Written so as to be self-contained, it is usable both as a self-study guide for professionals and as a textbook for undergraduate and beginning gra...
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Mar 1 1988 |
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Logic testing and design for testability Fujiwara H., Massachusetts Institute of Technology, Cambridge, MA, 1985. Type: Book (9789780262060967)
The testing of digital circuits has become more and more important as the complexity of digital systems has increased. Testing in the hardware world means verifying that a circuit has been manufactured properly. Checking that the desig...
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Jul 1 1986 |
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