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	Eilers, Reef     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       RT level timing modeling for aging prediction Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W.  DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany, Mar 14-18, 2016) 297-300, 2016.  Type: Proceedings Transistor aging has grown as a critical reliability issue that shortens the lifetime of electronic devices and slows down the circuits inside these devices. During the past decade, researchers have proposed various techniques to deal ...... Sep 9 2016
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