Search
for Author
All Reviews
Helms, Domenik
Options:
All Media Types
Journals
Proceedings
Div Books
Whole Books
Other
Date Reviewed
Title
Author
Publisher
Published Date
Descending
Ascending
Date Reviewed
1
-
1
of
1
reviews
RT level timing modeling for aging prediction
Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W. DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany, Mar 14-18, 2016) 297-300, 2016. Type: Proceedings
Transistor aging has grown as a critical reliability issue that shortens the lifetime of electronic devices and slows down the circuits inside these devices. During the past decade, researchers have proposed various techniques to deal ...
...
Sep 9 2016
Reproduction in whole or in part without permission is prohibited. Copyright 1999-2024 ThinkLoud
®
Terms of Use
|
Privacy Policy