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	Fujiwara, Hideo     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 2 of 2 reviews       Logic testing and design for testability Fujiwara H., MIT Press, Cambridge, MA, 1986.  Type: Book (9789780262060967) This text provides an excellent introduction to the problems of testing logic circuits. Written so as to be self-contained, it is usable both as a self-study guide for professionals and as a textbook for undergraduate and beginning gra...... Mar 1 1988     Logic testing and design for testability Fujiwara H., Massachusetts Institute of Technology, Cambridge, MA, 1985.  Type: Book (9789780262060967) The testing of digital circuits has become more and more important as the complexity of digital systems has increased. Testing in the hardware world means verifying that a circuit has been manufactured properly. Checking that the desig...... Jul 1 1986
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