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1-6 of 6 Reviews about "
Sequential Circuits (B.6.1...)
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Towards ultra-efficient QCA reversible circuits
Chabi A., Roohi A., Khademolhosseini H., Sheikhfaal S., Angizi S., Navi K., DeMara R. Microprocessors & Microsystems 49(C): 127-138, 2017. Type: Article
In this paper, quantum-dot cellular automata (QCA) nanotechnology is introduced and employed to design some basic integrated circuit components. Compared to the traditional complementary metal-oxide semiconductor (CMOS) technology, a 2...
May 1 2017
Finite state machines in hardware: theory and design (with VHDL and SystemVerilog)
Pedroni V., The MIT Press, Cambridge, MA, 2013. 352 pp. Type: Book (978-0-262019-66-8)
Digital circuits where the output values depend on the state of the system are called sequential. A finite state machine (FSM) is a modeling technique for sequential circuits. At any point of its operation, the machine will be in one o...
Jul 10 2014
Sequential logic
Cavanagh J., CRC Press, Inc., Boca Raton, FL, 2006. 912 pp. Type: Book (9780849375644)
This is the sort of engineering book that one initially might deem inessential for practice; however, with further consideration, one might realize its value as a handy reference. It is encyclopedic in its depth of presentation, and, t...
Nov 15 2006
Novel state minimization and state assignment in finite state machine design for low-power portable devices
Shiue W. Integration, the VLSI Journal 38(4): 549-570, 2005. Type: Article
The goal of the paper is to develop synthesis techniques for the next-state logic in finite state machines (FSMs) to optimize power, area, and delay. While technically sound, numerous grammatical, typographical, and figure errors cloud...
Feb 17 2006
Combining GAs and symbolic methods for high quality tests of sequential circuits
Keim M., Drechsler N., Drechsler R. (ed), Becker B. Journal of Electronic Testing: Theory and Applications 17(1): 37-51, 2001. Type: Article
The generation of tests for sequential circuits is of practical interest because manufacturing imperfections mean that not all manufactured circuits will be defect-free. It is desirable to have a set of tests that can uncover the maxi...
Feb 25 2003
Checking experiments in sequential machines
Bhattacharya A., John Wiley & Sons, Inc., New York, NY, 1989. Type: Book (9789780470213650)
This book presents a complete discussion of the theory and techniques of fault detection and correction for sequential logic circuits. The intended audience seems to be professionals in the field as the book is rather terse. It could s...
May 1 1990
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