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	Matej, M.     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Classification of defective analog integrated circuits using artificial neural networks Stopjaková V., Malošek P., Mičušík D., Matej M., Margala M. Journal of Electronic Testing: Theory and Applications 20(1): 25-37, 2004.  Type: Article The simulation results of applying the theory of artificial neural networks (ANN) to the problem of detecting catastrophic defects injected into a two-stage operational amplifier are presented in this paper....... Oct 7 2004
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