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	Delay/power modeling and optimization of FinFET circuit modules under PVT variations: observing the trends between the 22nm and 14nm technology nodes Tang A., Gao X., Chen L., Jha N. ACM Journal on Emerging Technologies in Computing Systems12(4):1-21,2016.Type:Article     Published By: ACM Press       Use your personal or institutional subscription to read the fulltext of the article.               You can purchase an article without having a subscription.
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