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	Delay/power modeling and optimization of FinFET circuit modules under PVT variations:observing the trends between the 22nm and 14nm technology nodes Tang A., Gao X., Chen L., Jha N. ACM Journal on Emerging Technologies in Computing Systems12(4):1-21,2016.Type:Article                     To:   Your Colleague's E-mail:     From:   Your E-mail:     Subject: Reviews: Delay/power modeling and optimization of FinFET circuit modules under PVT variations     Message Body:
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