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	Blanton, Ronald D.     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       DFM evaluation using IC diagnosis data Blanton R., Wang F., Xue C., Nag P., Xue Y., Li X. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 36(3): 463-474, 2017.  Type: Article During the processes of designing and manufacturing integrated circuits, the yield, which is calculated as the percentage of manufactured integrated circuits that pass all of the tests and function properly, is one of the major concern...... Apr 27 2018
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