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	Huang, Letian     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Tolerating transient illegal turn faults in NoCs Huang L., Zhang X., Ebrahimi M., Li G. Microprocessors & Microsystems 43(C): 104-115, 2016.  Type: Article Faults in on-chip level networks are very common. There have been multiple approaches to detect and correct faults in different levels, such as the error-detecting code (EDC) and error-correcting code (ECC) used in the data packet, cyc...... Jul 29 2016
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