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	Zhang, Yuqun     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       DeepFL: integrating multiple fault diagnosis dimensions for deep fault localization Li X., Li W., Zhang Y., Zhang L.  ISSTA 2019 (Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis, Beijing, China, Jul 15-19, 2019) 169-180, 2019.  Type: Proceedings Testing is a very important activity in software development. With testing comes the need to find the origin of the defects detected. This need is also important when failures occur in production. Finding the origin of such problems is...... Nov 21 2019
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