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Gao, Xun
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Delay/power modeling and optimization of FinFET circuit modules under PVT variations: observing the trends between the 22nm and 14nm technology nodes
Tang A., Gao X., Chen L., Jha N. ACM Journal on Emerging Technologies in Computing Systems 12(4): 1-21, 2016. Type: Article
Driven by the increasing demands of low power and high performance, the semiconductor industry has pushed the device down to below 20 nanometer (nm) scale. Downscaling introduced several challenges, among which short channel effect is ...
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Apr 28 2016
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