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	Ferraro-Petrillo, Umberto     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Data structures resilient to memory faults: an experimental study of dictionaries Ferraro-Petrillo U., Grandoni F., Italiano G. Journal of Experimental Algorithmics 181.1-1.14, 2013.  Type: Article Soft errors in electronics equipment can be caused by alpha particles or noise, and can change data that is being processed. The chance of these errors occuring increases with the size and speed of the memory used by the component. Mem...... Dec 27 2013
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