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	Eloff, Jan     Options: All Media Types Journals Proceedings Div Books Whole Books Other Date Reviewed Title Author Publisher Published Date Descending Ascending Date Reviewed     1 - 1 of 1 reviews       Software failure investigation: a near-miss analysis approach Eloff J., Bella M., Springer International Publishing, New York, NY, 2017. 119 pp.  Type: Book (978-3-319613-33-8) This book bothered me. There were profound positives and profound negatives that I discovered as I proceeded through the (very short, barely 100-meaty-page) book....... Feb 15 2018
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