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Automatically learning semantic features for defect prediction
Wang S., Liu T., Tan L. ICSE 2016 (Proceedings of the 38th International Conference on Software Engineering, Austin, TX, May 14-22, 2016) 297-308, 2016. Type: Proceedings
Have data? Try teaching a machine. Any problem space that has a large amount of data is just asking for someone to apply machine learning to find a solution. Defect detection is one such domain. With an extensive number of open-source ...
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Feb 25 2020
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