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  Browse All Reviews > Software (D) > Software Engineering (D.2) > Testing And Debugging (D.2.5)
  Testing And Debugging (D.2.5) See Reviews  
Subject Descriptors:
Code Inspections And Walk-Throughs (26)
Debugging Aids (59)
Diagnostics (17)
Distributed Debugging (6)
Error Handling And Recovery (51)
Monitors (13)
Symbolic Execution (22)
Testing Tools (105)
Tracing (26)
Proper Nouns:
CBUG (1)
Ctrace (1)
Debug (4)
Proust (1)
Rxvp (1)
Sees (1)
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Reviews about "Testing And Debugging (D.2.5)":
Date Reviewed
Is the stack distance between test case and method correlated with test effectiveness?
Niedermayr R., Wagner S.  EASE 2019 (Proceedings of the Evaluation and Assessment on Software Engineering, Copenhagen, Denmark,  Apr 15-17, 2019) 189-198, 2019. Type: Proceedings
Mar 15 2021
 Modern debugging: the art of finding a needle in a haystack
Spinellis D.  Communications of the ACM 61(11): 124-134, 2018. Type: Article
Oct 26 2020
Keeping master green at scale
Ananthanarayanan S., Ardekani M., Haenikel D., Varadarajan B., Soriano S., Patel D., Adl-Tabatabai A.  EuroSys 2019 (Proceedings of the Fourteenth EuroSys Conference 2019, Dresden, Germany,  Mar 25-28, 2019) 1-15, 2019. Type: Proceedings
Jun 15 2020
DeFlaker: automatically detecting flaky tests
Bell J., Legunsen O., Hilton M., Eloussi L., Yung T., Marinov D.  ICSE 2018 (Proceedings of the 40th International Conference on Software Engineering, Gothenburg, Sweden,  May 27-Jun 3, 2018) 433-444, 2018. Type: Proceedings
May 20 2020
Automatically learning semantic features for defect prediction
Wang S., Liu T., Tan L.  ICSE 2016 (Proceedings of the 38th International Conference on Software Engineering, Austin, TX,  May 14-22, 2016) 297-308, 2016. Type: Proceedings
Feb 25 2020
DeepFL: integrating multiple fault diagnosis dimensions for deep fault localization
Li X., Li W., Zhang Y., Zhang L.  ISSTA 2019 (Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis, Beijing, China,  Jul 15-19, 2019) 169-180, 2019. Type: Proceedings
Nov 21 2019
 Bits and bugs: a scientific and historical review of software failures in computational science
Huckle T., Neckel T.,  Society for Industrial and Applied Mathematics, Philadelphia, PA, 2019. 251 pp. Type: Book (978-1-611975-55-0)
Nov 20 2019
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