Computing Reviews
Today's Issue Hot Topics Search Browse Recommended My Account Log In
Browse by topic Browse by titles Authors Reviewers Browse by issue Browse Help
Search
  Browse All Reviews > Software (D) > Software Engineering (D.2) > Testing And Debugging (D.2.5)
 
  Testing And Debugging (D.2.5) See Reviews  
 
Subject Descriptors:
Code Inspections And Walk-Throughs (26)
Debugging Aids (59)
Diagnostics (17)
Distributed Debugging (6)
Error Handling And Recovery (53)
Monitors (13)
Symbolic Execution (22)
Testing Tools (105)
Tracing (26)
 
Proper Nouns:
CBUG (1)
Ctrace (1)
Debug (4)
Proust (1)
Rxvp (1)
Sees (1)
 
 
Reviews limited to:
 
 

Reviews about "Testing And Debugging (D.2.5)":
Date Reviewed
Data-driven anomaly detection with timing features for embedded systems
Lu S., Lysecky R.  ACM Transactions on Design Automation of Electronic Systems 24(3): 1-27, 2019. Type: Article
Oct 20 2021
 Data cleaning
Ilyas I., Chu X.,  ACM Books, New York, NY, 2019. 271 pp. Type: Book (978-1-450371-54-4)
Aug 4 2021
Is the stack distance between test case and method correlated with test effectiveness?
Niedermayr R., Wagner S.  EASE 2019 (Proceedings of the Evaluation and Assessment on Software Engineering, Copenhagen, Denmark,  Apr 15-17, 2019) 189-198, 2019. Type: Proceedings
Mar 15 2021
 Modern debugging: the art of finding a needle in a haystack
Spinellis D.  Communications of the ACM 61(11): 124-134, 2018. Type: Article
Oct 26 2020
Keeping master green at scale
Ananthanarayanan S., Ardekani M., Haenikel D., Varadarajan B., Soriano S., Patel D., Adl-Tabatabai A.  EuroSys 2019 (Proceedings of the Fourteenth EuroSys Conference 2019, Dresden, Germany,  Mar 25-28, 2019) 1-15, 2019. Type: Proceedings
Jun 15 2020
DeFlaker: automatically detecting flaky tests
Bell J., Legunsen O., Hilton M., Eloussi L., Yung T., Marinov D.  ICSE 2018 (Proceedings of the 40th International Conference on Software Engineering, Gothenburg, Sweden,  May 27-Jun 3, 2018) 433-444, 2018. Type: Proceedings
May 20 2020
Automatically learning semantic features for defect prediction
Wang S., Liu T., Tan L.  ICSE 2016 (Proceedings of the 38th International Conference on Software Engineering, Austin, TX,  May 14-22, 2016) 297-308, 2016. Type: Proceedings
Feb 25 2020
more...
 
 
Send Your Comments
Contact Us
Reproduction in whole or in part without permission is prohibited.   Copyright © 2000-2021 ThinkLoud, Inc.
Terms of Use
| Privacy Policy