Xinfei Guo is a final-year PhD candidate in the Computer Engineering Department at the University of Virginia, Charlottesville, VA. He received his BS degree in Electronic Materials and Devices in 2010 from Xidian University, China and his MSEE degree in 2012 from the University of Florida, Gainesville, FL. He joined the High Performance Low Power (HPLP) Lab at UVA in 2012, and began his PhD career. He has a broad interest in digital circuits and microarchitectures and has been working on power and reliability aspects. His current research projects focus on aging and accelerated recovery techniques (BTI and EM), cross-layer resilience design methodology, and energy-efficient design. Most recently, he started working in the Internet of Things (IoT) security and reliability field, including novel specialized architectures. During his PhD work, he has collaborated closely with Intel, AMD, IBM, and many other research groups, and publishes frequently at multiple refereed conferences, workshops, and journals in the VLSI and computer architecture fields.
He has been a committed reviewer for Computing Reviews since 2015, and has served as a reviewer for multiple IEEE and ACM journals (such as TCAD and TCAS-I) and conferences (such as DAC, ISCAS, ICCAD, and ISVLSI). He is a student member of the IEEE and ACM, and received the A. Richard Newton Young Student Fellowship from the 50th Design Automation Conference and the Achievement Award from the University of Florida in 2013 and 2010.
For more details, please visit his LinkedIn profile and personal website.