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Reviews about "Reliability And Testing (B.6.2)":
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Using implications to choose tests through suspect fault identification
Dworak J., Nepal K., Alves N., Shi Y., Imbriglia N., Bahar R. ACM Transactions on Design Automation of Electronic Systems 18(1): 1-19, 2012. Type: Article
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Efficient branch and bound search with application to computer-aided design
Chen X., Bushnell M., Kluwer Academic Publishers, Norwell, MA, 1996. Type: Book (9780792396734)
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Accumulator-Based Compaction of Test Responses
Rajski J., Tyszer J. IEEE Transactions on Computers 42(6): 643-650, 1993. Type: Article
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Sequential logic testing and verification
Ghosh A., Devadas S., Newton A., Kluwer Academic Publishers, Norwell, MA, 1992. Type: Book (9780792391883)
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On Computing Signal Probability and Detection Probability of Stuck-At Faults
Chakravarty S., Hunt H. IEEE Transactions on Computers 39(11): 1369-1377, 1990. Type: Article
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Design of High-Speed and Cost-Effective Self-Testing Checkers for Low-Cost Arithmetic Codes
Piestrak S. IEEE Transactions on Computers 39(3): 360-374, 1990. Type: Article
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Invariance of complexity measures for networks with unreliable gates
Pippenger N. Journal of the ACM 36(3): 531-539, 1989. Type: Article
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