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Guo, Xinfei
University of Virginia
Charlottesville, Virginia
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| Xinfei Guo is a final-year PhD candidate in the Computer Engineering Department at the University of Virginia (UVA), Charlottesville, VA. He received his BS degree in Electronic Materials and Devices in 2010 from Xidian University, China and his MSEE degree in 2012 from the University of Florida, Gainesville, FL. He joined the High Performance Low Power (HPLP) Lab at UVA in 2012, and began his PhD career. He has a broad interest in digital circuits and microarchitectures and has been working on power and reliability aspects. His current research projects focus on aging and accelerated recovery techniques (BTI and EM), cross-layer resilience design methodology, and energy-efficient design. Most recently, he started working in the Internet of Things (IoT) security and reliability field, including novel specialized architectures. During his PhD work, he has collaborated closely with Intel, AMD, IBM, and many other research groups, and publishes frequently at multiple refereed conferences and workshops, and in journals in the VLSI and computer architecture fields. He has been a committed reviewer for Computing Reviews since 2015, and has served as a reviewer for multiple IEEE and ACM journals (such as TCAD and TCAS-I) and conferences (such as DAC, ISCAS, ICCAD, and ISVLSI). He is a student member of the IEEE and ACM, and received the A. Richard Newton Young Student Fellowship from the 50th Design Automation Conference and the Achievement Award from the University of Florida in 2013 and 2010. For more details, please visit his LinkedIn profile and personal website. |
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1 - 9 of 9
reviews
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Area-energy tradeoffs of logic wear-leveling for BTI-induced aging Ashraf R., Khoshavi N., Alzahrani A., DeMara R., Kiamehr S., Tahoori M. CF 2016 (Proceedings of the ACM International Conference on Computing Frontiers, Como, Italy, May 16-19, 2016) 37-44, 2016. Type: Proceedings
As technology nodes are scaled down into the nanometer level, the reliability of the devices for an electronic chip becomes critical. Among various reliability threats, aging is one of the most prominent, as it introduces gradual param...
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Oct 4 2016 |
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Area-energy tradeoffs of logic wear-leveling for BTI-induced aging Ashraf R., Khoshavi N., Alzahrani A., DeMara R., Kiamehr S., Tahoori M. CF 2016 (Proceedings of the ACM International Conference on Computing Frontiers, Como, Italy, May 16-19, 2016) 37-44, 2016. Type: Proceedings
As technology nodes are scaled down into the nanometer level, the reliability of the devices for an electronic chip becomes critical. Among various reliability threats, aging is one of the most prominent, as it introduces gradual param...
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Oct 4 2016 |
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RT level timing modeling for aging prediction Koppaetzky N., Metzdorf M., Eilers R., Helms D., Nebel W. DATE 2016 (Proceedings of the 2016 Conference on Design, Automation & Test in Europe, Dresden, Germany, Mar 14-18, 2016) 297-300, 2016. Type: Proceedings
Transistor aging has grown as a critical reliability issue that shortens the lifetime of electronic devices and slows down the circuits inside these devices. During the past decade, researchers have proposed various techniques to deal ...
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Sep 9 2016 |
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Reliability-aware design to suppress aging Amrouch H., Khaleghi B., Gerstlauerz A., Henkel J. DAC 2016 (Proceedings of the 53rd Annual Design Automation Conference, Austin, TX, Jun 5-9, 2016) 1-6, 2016. Type: Proceedings
In the biological world, humans age over time. Similar to this, small components like transistors in an electronic chip also age as the system runs. This will slow the system down and cause potential failures while the system is still ...
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Jun 28 2016 |
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Modeling, profiling, and debugging the energy consumption of mobile devices Hoque M., Siekkinen M., Khan K., Xiao Y., Tarkoma S. ACM Computing Surveys 48(3): 1-40, 2015. Type: Article
Because mobile devices, like smartphones, are usually powered with small-size batteries that have limited capacity and life, hardware engineers need to be smart at designing energy-efficient systems to run the applications with minimal...
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Jun 23 2016 |
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Beat frequency detector-based high-speed true random number generators: statistical modeling and analysis Lao Y., Tang Q., Kim C., Parhi K. ACM Journal on Emerging Technologies in Computing Systems 13(1): 1-25, 2016. Type: Article
With the increased number of personal electronic devices, the security of these devices and personal information has become a big concern. As effective solutions to securing a system, encryption and the signing of confidential informat...
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Jun 16 2016 |
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Beat frequency detector-based high-speed true random number generators: statistical modeling and analysis Lao Y., Tang Q., Kim C., Parhi K. ACM Journal on Emerging Technologies in Computing Systems 13(1): 1-25, 2016. Type: Article
With the increased number of personal electronic devices, the security of these devices and personal information has become a big concern. As effective solutions to securing a system, encryption and the signing of confidential informat...
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Jun 16 2016 |
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Delay/power modeling and optimization of FinFET circuit modules under PVT variations: observing the trends between the 22nm and 14nm technology nodes Tang A., Gao X., Chen L., Jha N. ACM Journal on Emerging Technologies in Computing Systems 12(4): 1-21, 2016. Type: Article
Driven by the increasing demands of low power and high performance, the semiconductor industry has pushed the device down to below 20 nanometer (nm) scale. Downscaling introduced several challenges, among which short channel effect is ...
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Apr 28 2016 |
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Delay/power modeling and optimization of FinFET circuit modules under PVT variations: observing the trends between the 22nm and 14nm technology nodes Tang A., Gao X., Chen L., Jha N. ACM Journal on Emerging Technologies in Computing Systems 12(4): 1-21, 2016. Type: Article
Driven by the increasing demands of low power and high performance, the semiconductor industry has pushed the device down to below 20 nanometer (nm) scale. Downscaling introduced several challenges, among which short channel effect is ...
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Apr 28 2016 |
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